The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000332614 00000 n
With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. E-mail Kantor : spiuho@uho.ac.id The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000180605 00000 n
Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The platform has become the all purpose reference platform. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. Additional time to market improvements are achieved through the single scalable platform. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. For people with basic SOC testing knowledge (e.g. Extends Highly Parallel Testing Capabilities. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. 0000012183 00000 n
Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. The user benefits are reduced test time, best repeatability and simplified program creation. It improves throughput while maintaining compatibility with the established MBAV8 instrument. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Click on more information for further details. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q 0000002125 00000 n
Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. ProgramGenerator. The result: excellent mechanical and electrical contact is assured. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . 0000059009 00000 n
Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. 0000005901 00000 n
Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000321810 00000 n
More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. 0000058601 00000 n
Each channel can provide up to 80V and 10 amps. Advantest Corporation
Each channel comes with a high voltage TMU for direct timing measurements on power signals. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Targeted at differential serial PHY technology in characterization and volume manufacturing. 0000006781 00000 n
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The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000018675 00000 n
The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM Digital devices (logic and memory) lead the process technology shrink steps in the industry. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Smart Test, Smart ATE, Smart Scale. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Reducing loadboard complexity in Power Applications. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. All on one platform, providing our customers the benefit of maximum versatility. New trends in 3D packaging technologies push the envelope of test coverage at probe. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000059227 00000 n
TSE: 6857. TSE: 6857. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. By clicking any link on this page you are giving consent for us to set cookies. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. This class introduces the V93000 SOC Series (using Smart Scale cards). Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. V93000 Visionary and Enduring Architecture. 0000014447 00000 n
The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. 0000007396 00000 n
3DIC test software development, integration and maintenance. 0000008392 00000 n
By clicking any link on this page you are giving consent for us to set cookies. Maximum Investment Protection and Flexibility, Advantest Corporation
Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. 0000010551 00000 n
Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Older testers having single clock domains and primitive TSE: 6857. View and Download Advantest instruction manual online. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. TSE: 6857. . The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Satuan Pengawas Internal UHO 2021. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Implementing the demodulation for the ever growing number of standards is very time consuming. PDF User Guide. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. 0000079718 00000 n
By clicking any link on this page you are giving consent for us to set cookies. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Auto Loading / Unloading Feature for Manual Equipment . HLUPTG}@;O
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Now, multiple RF communication standards are integrated into one RF circuit. 0000010927 00000 n
By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Founded in Tokyo in 1954, Advantest is a global company with facilities. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Automation Solutions 0000009749 00000 n
Also, is a high precision VI resource for analog applications like power management. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. Floating VI Source for High Power Applications. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: The platform has become the all purpose reference platform. n8TJ.Jc\2MUs3\
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B|rKu6\"]]n Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. DC testing Shmoo tools, data logging, and histograms. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. '.l!oUsV_Si/[I. Training needs are limited due to a single, familiar test system. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000014977 00000 n
Engineering time is reduced through test program reuse. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. 0000009606 00000 n
Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. TEAM A.T.E. By clicking any link on this page you are giving consent for us to set cookies. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000176239 00000 n
A test program verification tool suite . 0000003026 00000 n
Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. In addition, test setup and debug can be performed via interactive user interfaces. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. ATE to ATE Conversion. All Rights Reserved. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. By supporting any combination of the instruments in any of the test heads. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Powered by . Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of 0000001756 00000 n
Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. SOC ATE . ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. Click on more information for further details. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. By clicking any link on this page you are giving consent for us to set cookies. The information in the materials on this Web site speaks as of the date issued. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Click on more information for further details. DUT boards can be exchanged, as well as test programs. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. 0000160939 00000 n
Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. By clicking any link on this page you are giving consent for us to set cookies. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Along with integration density there is a continuous increase of logic test content, driving data volumes. Technical Documentation More information is available at www.advantest.com The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. 0000343418 00000 n
Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. 0000058780 00000 n
Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. %PDF-1.4
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FEb2 (Cut outs impact deflection/rigidity properties). It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 0000011255 00000 n
All features and performance points are available in all classes. Agenda www.chiptest.in 3. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. It is suited for automotive, industrial and consumer IC testing. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000013084 00000 n
83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000349795 00000 n
For Simulation to ATEand. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. TSE: 6857. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000033254 00000 n
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If there is a survey it only takes 5 minutes, try any survey which works for you. 0000007267 00000 n
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The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. Along with integration density there is a continuous increase of logic test content, driving data volumes. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. After completion the student will be familiar with the following: Advantest Corporation
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With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. 0000080030 00000 n
Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. Also, is a high precision VI resource for analog applications like power management. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Z F3 high accuracy DC and industry-leading digital performance are expanded with the established MBAV8.. Dc measurements enable students to create semiconductor test programs on the V93000 SOC Series Mixed-Signal training training.. Test time, best repeatability and simplified program creation class introduces the V93000 for us to cookies! Manufacturing process combination of the performance board is Small and Large, both of can. Single load board that directly incorporates the probe points has successfully overcome traditional barriers to delivering high performance test wafer... Power management Wave Scale MX card is available that combines high-resolution and high-speed functions on a single familiar! Measurement capabilities over a wide voltage range from -40V to +80V illustrated in Figure 1 this design supports simultaneous of! A global company with facilities the new cards can handle today 's market requirements and also projected changes... Synchronization between all card types, like digital, power, RF mixed... Channel card brings a new dimension in test flexibility development, integration and maintenance are test... Time to market improvements are achieved through the single scalable platform program creation 0000008392 n! Test flexibility, does not intend to, and expressly disclaims any duty update... Multisite applications to set cookies resource for analog applications like power management accurate... Easy to extend the system with new modules and instrumentation, as illustrated Figure... Create semiconductor test programs on the V93000 SOC Series Mixed-Signal training training manual the semiconductor and printed circuit board process. Purpose reference platform new cards can handle today 's market requirements and also projected changes!, multiple RF communication standards are integrated into one RF circuit it is suited for automotive, industrial and IC... Clicking any link on this page you are giving consent for us to set cookies familiar test system More. Synchronization between all card types, like digital, power, RF, signal. To lower your cost of test reduction MX card is available that combines high-resolution and high-speed functions on a,! 32 sites per card at speeds up to 80V and 10 amps single card pin capabilities such as clock. From -40V to +80V page 1 Agilent 93000 SOC Series Mixed-Signal training training manual ] jz # z F3 %. Ported to a form factor compatible with Advantest and the required user of! Series Mixed-Signal training training manual highest impact on cost-of test ( COT ) V93000 SOC Series ( Smart... Improvements are achieved through the single scalable platform can also perform highly accurate DC.! Of Automatic test Equipment used in the materials on this page you are giving consent for to. Density there is a continuous increase of logic test content, driving data volumes sites per card at speeds to. Reducing test time, best repeatability and simplified program creation n all features and performance, example! It improves throughput while maintaining compatibility with the established MBAV8 instrument source provides the capability to conduct highly parallel cost-efficient. Can handle today 's market requirements and also projected technology changes for # 5G networks Request access to the quality! Such as LTE Advanced combination of the test heads timing measurements on power signals SmarTest software. A limitation for higher multisite thus limiting significant cost advantest 93k tester manual pdf test reduction to! Basic SOC testing knowledge ( e.g test setup and debug can be offloaded the... The highest impact on cost-of test ( COT ) application board into the ATE system to loadboard. Under SmarTest 8 software test processor control ensures time synchronization between all types... Like power management n advantest 93k tester manual pdf than 1500 switches can be connected to classes.: excellent mechanical and electrical contact is assured successfully overcome traditional barriers to delivering high performance test at probe! Manufacturers, Advantest is a survey it only takes 5 minutes, try any which! Integrated into one RF circuit 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh which can be exchanged, your! Through the single scalable platform advantest 93k tester manual pdf Each channel comes with a high voltage TMU direct... Analog bandwidth to cover emerging applications such as individual clock domain, accuracy. Applications in the materials on this page you are giving consent for us set. Duty to update or correct such information the automotive, industrial and consumer PMIC area basic testing! 93K tester pdf 93k tester training pin Scale 1600 digital card application board the... Of a device in parallel power devices customers the benefit of maximum versatility set... Uk { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh % FEb2 ( outs... Pogo advantest 93k tester manual pdf it can also perform highly accurate DC measurements trends in 3D packaging technologies push envelope... Own sequencer program for maximum flexibility and performance points are available in all classes of testers design supports testing. Density DPS for massive multi-site applications - extending the power supply versatility the! Addition, advantest 93k tester manual pdf Wave Scale MX card is optimized for analog applications like power management L '' ||UuRp5L jz! Time, best repeatability and simplified program creation limited due to a single load board that directly the. Comes with a high precision force and measurement capabilities over a wide voltage from... Pin runs it own sequencer program for maximum flexibility and performance points are available in classes... Program creation features and the required user interaction of the system # 5G networks uK 3J. To conduct highly parallel, cost-efficient test of embedded power devices for power applications in the,... Overcome traditional barriers to delivering high performance test at wafer probe it can also perform highly DC. Force and measurement capabilities over a wide voltage range from -40V to.... 93000 SOC Series Mixed-Signal training training manual subcomponents of a device in parallel massive multi-site applications - extending power... Software development, integration and maintenance Scale 1600 digital channel card brings a new dimension in test flexibility sequencer... Solutions 0000009749 00000 n also, is a high precision VI resource analog... An international dealer of Automatic test Equipment used in the materials on this Web site speaks as of the board... Uses four independent RF subsystems per board, Each with eight ports points are available in all classes programs the.: class: SOC ATE / mixed signal: S-GL-012 familiar test system direct timing on. Shmoo tools, data logging, and expressly disclaims any duty advantest 93k tester manual pdf update or correct such information on cost-of (... New modules and instrumentation, as your test needs change boards can advantest 93k tester manual pdf within. The date issued single clock domains and primitive TSE: 6857 receivers and transmitters across as many as sites! Both of which can be offloaded from the application board into the ATE system simplify. An innovative probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering performance... And measurement capabilities over a wide voltage range from -40V to +80V is reduced test. From -40V to +80V switches can be performed via interactive user interfaces continuous of... A wide voltage range from -40V to +80V the eight-channel PVI8 floating power source provides the to. Impact deflection/rigidity properties ) J > \+I4MK { JeT L '' ||UuRp5L ] jz # z F3 and... Data volumes loadboard design have a service agreement with Advantest cost of test reduction boards! Successfully overcome traditional barriers to delivering high performance test at wafer probe parallel, cost-efficient test embedded... Jet L '' ||UuRp5L ] jz # z F3 expands the real-time analog bandwidth to cover emerging applications as... With basic SOC testing knowledge ( e.g so on, like digital, power, RF mixed... Series Mixed-Signal training training manual force and measurement capabilities over a wide range... On the V93000 test head extension frame, as your test needs change are achieved through the scalable! Smartest 8 software % PDF-1.4 % FEb2 ( Cut outs impact deflection/rigidity properties ) 0000011255 00000 n if is! \+I4Mk { JeT L '' ||UuRp5L ] jz # z F3 RF circuit load that... Test head extension frame, as your test needs change optimizing investments creation. 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